Редактирование: Whole brain emulation (раздел)

==== FIBSEM ====

The semiconductor industry has long used focused ion beams to perform failure analysis tests on integrated circuits. [http://www.fei.com/ FEI] researchers have shown that this can be used to image [[#Plastination|plastinated]] neural tissue.

An ion beam ablates the top 30 to 50 nanometers of a 100x100μm tissue sample. The backscatter is imaged by the SEM, and the process is then repeated. It is similar to SBFSEM, but without the problems caused by high beam current.